SEMICONDUCTOR DEVICE AND MEASURING METHOD
There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order fr...
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| creator | FUKAZAWA, Mitsuya NOLF, Robert SHUTO, Makoto DALBY, Robert KAWAI, Kazuyoshi |
| description | There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency. |
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| subjects | BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING CONTROL OF AMPLIFICATION DECODING ELECTRICITY IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESONATORS TESTING |
| title | SEMICONDUCTOR DEVICE AND MEASURING METHOD |
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