SEMICONDUCTOR DEVICE AND MEASURING METHOD

There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order fr...

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Bibliographische Detailangaben
Hauptverfasser:	FUKAZAWA, Mitsuya, NOLF, Robert, SHUTO, Makoto, DALBY, Robert, KAWAI, Kazuyoshi
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING CONTROL OF AMPLIFICATION DECODING ELECTRICITY IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESONATORS TESTING
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Beschreibung
Zusammenfassung:	There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency.