UNIVERSAL MANUFACTURING TEST PLATFORM
Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, th...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | FREITAS, Rachael C FATTU, Michael ZACHARAKIS-JUTZ, George FATTU, Khajistha |
| description | Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018106702A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018106702A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018106702A13</originalsourceid><addsrcrecordid>eNrjZFAN9fMMcw0KdvRR8HX0C3VzdA4JDfL0c1cIcQ0OUQjwcQxx8w_y5WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGFoYGZuYGRo6GxsSpAgBVaySI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>UNIVERSAL MANUFACTURING TEST PLATFORM</title><source>esp@cenet</source><creator>FREITAS, Rachael C ; FATTU, Michael ; ZACHARAKIS-JUTZ, George ; FATTU, Khajistha</creator><creatorcontrib>FREITAS, Rachael C ; FATTU, Michael ; ZACHARAKIS-JUTZ, George ; FATTU, Khajistha</creatorcontrib><description>Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; CURRENT COLLECTORS ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; LINE CONNECTORS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180419&DB=EPODOC&CC=US&NR=2018106702A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180419&DB=EPODOC&CC=US&NR=2018106702A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FREITAS, Rachael C</creatorcontrib><creatorcontrib>FATTU, Michael</creatorcontrib><creatorcontrib>ZACHARAKIS-JUTZ, George</creatorcontrib><creatorcontrib>FATTU, Khajistha</creatorcontrib><title>UNIVERSAL MANUFACTURING TEST PLATFORM</title><description>Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>CURRENT COLLECTORS</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>LINE CONNECTORS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAN9fMMcw0KdvRR8HX0C3VzdA4JDfL0c1cIcQ0OUQjwcQxx8w_y5WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGFoYGZuYGRo6GxsSpAgBVaySI</recordid><startdate>20180419</startdate><enddate>20180419</enddate><creator>FREITAS, Rachael C</creator><creator>FATTU, Michael</creator><creator>ZACHARAKIS-JUTZ, George</creator><creator>FATTU, Khajistha</creator><scope>EVB</scope></search><sort><creationdate>20180419</creationdate><title>UNIVERSAL MANUFACTURING TEST PLATFORM</title><author>FREITAS, Rachael C ; FATTU, Michael ; ZACHARAKIS-JUTZ, George ; FATTU, Khajistha</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018106702A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>CURRENT COLLECTORS</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>LINE CONNECTORS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>FREITAS, Rachael C</creatorcontrib><creatorcontrib>FATTU, Michael</creatorcontrib><creatorcontrib>ZACHARAKIS-JUTZ, George</creatorcontrib><creatorcontrib>FATTU, Khajistha</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FREITAS, Rachael C</au><au>FATTU, Michael</au><au>ZACHARAKIS-JUTZ, George</au><au>FATTU, Khajistha</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>UNIVERSAL MANUFACTURING TEST PLATFORM</title><date>2018-04-19</date><risdate>2018</risdate><abstract>Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2018106702A1 |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING CURRENT COLLECTORS ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | UNIVERSAL MANUFACTURING TEST PLATFORM |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T19%3A07%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FREITAS,%20Rachael%20C&rft.date=2018-04-19&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2018106702A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |