UNIVERSAL MANUFACTURING TEST PLATFORM

Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, th...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	FREITAS, Rachael C, FATTU, Michael, ZACHARAKIS-JUTZ, George, FATTU, Khajistha
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING CURRENT COLLECTORS ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.