INTEGRATED SYSTEM AND METHOD FOR SOURCE/DRAIN ENGINEERING

Implementations described herein generally provide a method of processing a substrate. Specifically, the methods described are used for cleaning and etching source/drain regions on a silicon substrate in preparation for precise Group IV source/drain growth in semiconductor devices. Benefits of this...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHU Schubert S, CHUNG Hua, YAN Chun, BAO Xinyu, HON Melitta Manyin
Format: Patent
Sprache:eng
Schlagworte:
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