INTEGRATED CIRCUIT WITH LOW POWER SCAN SYSTEM

An integrated circuit operable in a scan mode includes a scan chain formed by cascaded flip-flop cells. Each flip-flop cell includes a master latch that receives a first data signal and generates a first latch signal, a slave latch that receives the first latch signal and generates a second latch si...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Zhang Wei, Wang Ling, Zhang Wanggen
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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