DUAL MAGNIFICATION APPARATUS AND SYSTEM FOR EXAMINING A SINGLE OBJECTIVE IN A SCANNING OPTICAL MICROSCOPE USING TWO WAVELENGTHS OF LIGHT

DUAL MAGNIFICATION APPARATUS AND SYSTEM FOR EXAMINING A SINGLE OBJECTIVE IN A SCANNING OPTICAL MICROSCOPE USING TWO WAVELENGTHS OF LIGHT

Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower ma...

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Hauptverfasser: Stoker David S, Hamilton Brett J
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Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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creator Stoker David S
Hamilton Brett J
description Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title DUAL MAGNIFICATION APPARATUS AND SYSTEM FOR EXAMINING A SINGLE OBJECTIVE IN A SCANNING OPTICAL MICROSCOPE USING TWO WAVELENGTHS OF LIGHT
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