DUAL MAGNIFICATION APPARATUS AND SYSTEM FOR EXAMINING A SINGLE OBJECTIVE IN A SCANNING OPTICAL MICROSCOPE USING TWO WAVELENGTHS OF LIGHT

DUAL MAGNIFICATION APPARATUS AND SYSTEM FOR EXAMINING A SINGLE OBJECTIVE IN A SCANNING OPTICAL MICROSCOPE USING TWO WAVELENGTHS OF LIGHT

Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower ma...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Stoker David S, Hamilton Brett J
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.