TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE

TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE

A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lig...

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Hauptverfasser: JEONG Song Ho, KIM Jong Tae, KWON Oh Seok, KIM Choo Ho, PARK Dae Seo
Format: Patent
Sprache:eng
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BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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creator JEONG Song Ho
KIM Jong Tae
KWON Oh Seok
KIM Choo Ho
PARK Dae Seo
description A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018040519A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018040519A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018040519A13</originalsourceid><addsrcrecordid>eNrjZPAOcQ0OUXAMCHAMcgwJDVZw9HNR8HX0C3VzdA4JDfL0c0eS83dT8PF09whRcPX1DAkBybm4hnk6uyoEODp7O7q78jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwNDCwMTA1NDS0dDY-JUAQBKaC6V</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE</title><source>esp@cenet</source><creator>JEONG Song Ho ; KIM Jong Tae ; KWON Oh Seok ; KIM Choo Ho ; PARK Dae Seo</creator><creatorcontrib>JEONG Song Ho ; KIM Jong Tae ; KWON Oh Seok ; KIM Choo Ho ; PARK Dae Seo</creatorcontrib><description>A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180208&amp;DB=EPODOC&amp;CC=US&amp;NR=2018040519A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180208&amp;DB=EPODOC&amp;CC=US&amp;NR=2018040519A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JEONG Song Ho</creatorcontrib><creatorcontrib>KIM Jong Tae</creatorcontrib><creatorcontrib>KWON Oh Seok</creatorcontrib><creatorcontrib>KIM Choo Ho</creatorcontrib><creatorcontrib>PARK Dae Seo</creatorcontrib><title>TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE</title><description>A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAOcQ0OUXAMCHAMcgwJDVZw9HNR8HX0C3VzdA4JDfL0c0eS83dT8PF09whRcPX1DAkBybm4hnk6uyoEODp7O7q78jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwNDCwMTA1NDS0dDY-JUAQBKaC6V</recordid><startdate>20180208</startdate><enddate>20180208</enddate><creator>JEONG Song Ho</creator><creator>KIM Jong Tae</creator><creator>KWON Oh Seok</creator><creator>KIM Choo Ho</creator><creator>PARK Dae Seo</creator><scope>EVB</scope></search><sort><creationdate>20180208</creationdate><title>TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE</title><author>JEONG Song Ho ; KIM Jong Tae ; KWON Oh Seok ; KIM Choo Ho ; PARK Dae Seo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018040519A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JEONG Song Ho</creatorcontrib><creatorcontrib>KIM Jong Tae</creatorcontrib><creatorcontrib>KWON Oh Seok</creatorcontrib><creatorcontrib>KIM Choo Ho</creatorcontrib><creatorcontrib>PARK Dae Seo</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JEONG Song Ho</au><au>KIM Jong Tae</au><au>KWON Oh Seok</au><au>KIM Choo Ho</au><au>PARK Dae Seo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE</title><date>2018-02-08</date><risdate>2018</risdate><abstract>A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.</abstract><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_US2018040519A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title TEST APPARATUS AND MANUFACTURING APPARATUS OF LIGHT EMITTING DEVICE PACKAGE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T02%3A39%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JEONG%20Song%20Ho&rft.date=2018-02-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2018040519A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true