LIGHT DETECTION DEVICE AND ELECTRONIC APPARATUS
A light detection device includes a semiconductor substrate, a signal detection light receiving portion that is formed in the semiconductor substrate, an infrared light receiving portion that is formed in the semiconductor substrate, a first color filter that covers the signal detection light receiv...
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| creator | OKUDA Norikazu TATEISHI Gota |
| description | A light detection device includes a semiconductor substrate, a signal detection light receiving portion that is formed in the semiconductor substrate, an infrared light receiving portion that is formed in the semiconductor substrate, a first color filter that covers the signal detection light receiving portion and that has a first spectral characteristic such that the first color filter passes therethrough light in a first wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, a second color filter that covers the infrared light receiving portion and that has a second spectral characteristic such that the second color filter passes therethrough light in a second wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, a third color filter that covers the infrared light receiving portion and that has a third spectral characteristic such that the third color filter passes therethrough light in a third wavelength range different from the second wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, and an infrared cut filter that covers the signal detection light receiving portion and that has an opening in a region opposite to the infrared light receiving portion. |
| format | Patent |
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COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180208&DB=EPODOC&CC=US&NR=2018038732A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180208&DB=EPODOC&CC=US&NR=2018038732A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OKUDA Norikazu</creatorcontrib><creatorcontrib>TATEISHI Gota</creatorcontrib><title>LIGHT DETECTION DEVICE AND ELECTRONIC APPARATUS</title><description>A light detection device includes a semiconductor substrate, a signal detection light receiving portion that is formed in the semiconductor substrate, an infrared light receiving portion that is formed in the semiconductor substrate, a first color filter that covers the signal detection light receiving portion and that has a first spectral characteristic such that the first color filter passes therethrough light in a first wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, a second color filter that covers the infrared light receiving portion and that has a second spectral characteristic such that the second color filter passes therethrough light in a second wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, a third color filter that covers the infrared light receiving portion and that has a third spectral characteristic such that the third color filter passes therethrough light in a third wavelength range different from the second wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, and an infrared cut filter that covers the signal detection light receiving portion and that has an opening in a region opposite to the infrared light receiving portion.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND38XT3CFFwcQ1xdQ7x9PcDssI8nV0VHP1cFFx9gGJB_n6ezgqOAQGOQY4hocE8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSQ-NNjIwNDCwNjC3NjI0dCYOFUAk_Ym4Q</recordid><startdate>20180208</startdate><enddate>20180208</enddate><creator>OKUDA Norikazu</creator><creator>TATEISHI Gota</creator><scope>EVB</scope></search><sort><creationdate>20180208</creationdate><title>LIGHT DETECTION DEVICE AND ELECTRONIC APPARATUS</title><author>OKUDA Norikazu ; TATEISHI Gota</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018038732A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OKUDA Norikazu</creatorcontrib><creatorcontrib>TATEISHI Gota</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OKUDA Norikazu</au><au>TATEISHI Gota</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LIGHT DETECTION DEVICE AND ELECTRONIC APPARATUS</title><date>2018-02-08</date><risdate>2018</risdate><abstract>A light detection device includes a semiconductor substrate, a signal detection light receiving portion that is formed in the semiconductor substrate, an infrared light receiving portion that is formed in the semiconductor substrate, a first color filter that covers the signal detection light receiving portion and that has a first spectral characteristic such that the first color filter passes therethrough light in a first wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, a second color filter that covers the infrared light receiving portion and that has a second spectral characteristic such that the second color filter passes therethrough light in a second wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, a third color filter that covers the infrared light receiving portion and that has a third spectral characteristic such that the third color filter passes therethrough light in a third wavelength range different from the second wavelength range within the wavelength range of visible light and in the wavelength range of infrared light, and an infrared cut filter that covers the signal detection light receiving portion and that has an opening in a region opposite to the infrared light receiving portion.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING |
| title | LIGHT DETECTION DEVICE AND ELECTRONIC APPARATUS |
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