EQUIPMENT CONTROL BASED ON FAILURE DETERMINATION
In some examples, a computing device may generate simulated data based on a physical model of equipment. For example, the simulated data may include a plurality of probability distributions of a plurality of degrees of failure, respectively, for at least one failure mode of the equipment. In additio...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HIRUTA Tomoaki GUPTA Chetan |
| description | In some examples, a computing device may generate simulated data based on a physical model of equipment. For example, the simulated data may include a plurality of probability distributions of a plurality of degrees of failure, respectively, for at least one failure mode of the equipment. In addition, the computing device may receive sensor data indicating a measured metric of the equipment. The computing device may compare the received sensor data with the simulated data to determine a failure mode and a degree of failure of the equipment. At least partially based on the determined failure mode and degree of failure of the equipment, the computing device may send at least one of a notification or a control signal. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018017467A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018017467A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018017467A13</originalsourceid><addsrcrecordid>eNrjZDBwDQz1DPB19QtRcPb3Cwny91Fwcgx2dVHw91Nwc_T0CQ1yVXBxDXEN8vX0cwzx9PfjYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoYWBobmJmbmjobGxKkCANezJ2M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>EQUIPMENT CONTROL BASED ON FAILURE DETERMINATION</title><source>esp@cenet</source><creator>HIRUTA Tomoaki ; GUPTA Chetan</creator><creatorcontrib>HIRUTA Tomoaki ; GUPTA Chetan</creatorcontrib><description>In some examples, a computing device may generate simulated data based on a physical model of equipment. For example, the simulated data may include a plurality of probability distributions of a plurality of degrees of failure, respectively, for at least one failure mode of the equipment. In addition, the computing device may receive sensor data indicating a measured metric of the equipment. The computing device may compare the received sensor data with the simulated data to determine a failure mode and a degree of failure of the equipment. At least partially based on the determined failure mode and degree of failure of the equipment, the computing device may send at least one of a notification or a control signal.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180118&DB=EPODOC&CC=US&NR=2018017467A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76292</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180118&DB=EPODOC&CC=US&NR=2018017467A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRUTA Tomoaki</creatorcontrib><creatorcontrib>GUPTA Chetan</creatorcontrib><title>EQUIPMENT CONTROL BASED ON FAILURE DETERMINATION</title><description>In some examples, a computing device may generate simulated data based on a physical model of equipment. For example, the simulated data may include a plurality of probability distributions of a plurality of degrees of failure, respectively, for at least one failure mode of the equipment. In addition, the computing device may receive sensor data indicating a measured metric of the equipment. The computing device may compare the received sensor data with the simulated data to determine a failure mode and a degree of failure of the equipment. At least partially based on the determined failure mode and degree of failure of the equipment, the computing device may send at least one of a notification or a control signal.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASURING</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBwDQz1DPB19QtRcPb3Cwny91Fwcgx2dVHw91Nwc_T0CQ1yVXBxDXEN8vX0cwzx9PfjYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoYWBobmJmbmjobGxKkCANezJ2M</recordid><startdate>20180118</startdate><enddate>20180118</enddate><creator>HIRUTA Tomoaki</creator><creator>GUPTA Chetan</creator><scope>EVB</scope></search><sort><creationdate>20180118</creationdate><title>EQUIPMENT CONTROL BASED ON FAILURE DETERMINATION</title><author>HIRUTA Tomoaki ; GUPTA Chetan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018017467A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>HIRUTA Tomoaki</creatorcontrib><creatorcontrib>GUPTA Chetan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIRUTA Tomoaki</au><au>GUPTA Chetan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>EQUIPMENT CONTROL BASED ON FAILURE DETERMINATION</title><date>2018-01-18</date><risdate>2018</risdate><abstract>In some examples, a computing device may generate simulated data based on a physical model of equipment. For example, the simulated data may include a plurality of probability distributions of a plurality of degrees of failure, respectively, for at least one failure mode of the equipment. In addition, the computing device may receive sensor data indicating a measured metric of the equipment. The computing device may compare the received sensor data with the simulated data to determine a failure mode and a degree of failure of the equipment. At least partially based on the determined failure mode and degree of failure of the equipment, the computing device may send at least one of a notification or a control signal.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2018017467A1 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | EQUIPMENT CONTROL BASED ON FAILURE DETERMINATION |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T07%3A22%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HIRUTA%20Tomoaki&rft.date=2018-01-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2018017467A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |