SAMPLE MEASUREMENT SYSTEM AND METHOD OF RETRIEVING TRAY IDENTIFICATION INFORMATION

SAMPLE MEASUREMENT SYSTEM AND METHOD OF RETRIEVING TRAY IDENTIFICATION INFORMATION

A sample measurement system may include: a measurement unit that measures a sample in a sample container; a transport unit that transports a rack that can hold sample containers, via the measurement unit; a collection unit that is detachably provided with a tray in which racks can be set, and that c...

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Hauptverfasser: TATSUTANI Hiroo, OHMAE Yuichiro
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator TATSUTANI Hiroo
OHMAE Yuichiro
description A sample measurement system may include: a measurement unit that measures a sample in a sample container; a transport unit that transports a rack that can hold sample containers, via the measurement unit; a collection unit that is detachably provided with a tray in which racks can be set, and that collects the rack transported from the measurement unit by the transport unit and sets the rack in the tray; a storage that stores sample identification information, rack identification information, and tray identification information in association with each other; an input part; a display part; and a controller that, in a condition in which the input part receives input of the sample identification information or the rack identification information, causes the display part to display the tray identification information stored in association with the inputted sample identification information or the inputted rack identification information.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SAMPLE MEASUREMENT SYSTEM AND METHOD OF RETRIEVING TRAY IDENTIFICATION INFORMATION
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