LITHOGRAPHIC APPARATUS AND METHOD

A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable elements and associated optical components of the illumination system to convert the radiation beam into a desired illumin...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: EURLINGS Markus Franciscus Antonius, VAN GREEVENBROEK Hendrikus Robertus Marie, ENDENDIJK Wilfred Edward, TINNEMANS Patricius Aloysius Jacobus, MULDER Heine Melle, BASELMANS Johannes Jacobus Matheus, ENGELEN Adrianus Franciscus Petrus, VAN DER VEEN Paul
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator EURLINGS Markus Franciscus Antonius
VAN GREEVENBROEK Hendrikus Robertus Marie
ENDENDIJK Wilfred Edward
TINNEMANS Patricius Aloysius Jacobus
MULDER Heine Melle
BASELMANS Johannes Jacobus Matheus
ENGELEN Adrianus Franciscus Petrus
VAN DER VEEN Paul
description A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable elements and associated optical components of the illumination system to convert the radiation beam into a desired illumination mode, the controlling including allocating different individually controllable elements to different parts of the illumination mode in accordance with an allocation scheme, the allocation scheme selected to provide a desired modification of one or more properties of the illumination mode, the radiation beam or both. The method also includes patterning the radiation beam having the desired illumination mode with a pattern in its cross-section to form a patterned beam of radiation, and projecting the patterned radiation beam onto a target portion of a substrate.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2017315450A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2017315450A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2017315450A13</originalsourceid><addsrcrecordid>eNrjZFD08Qzx8HcPcgzw8HRWcAwIcAxyDAkNVnD0c1HwdQVKufAwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ3NjQ1MTUwNHQ2PiVAEAotAjFw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LITHOGRAPHIC APPARATUS AND METHOD</title><source>esp@cenet</source><creator>EURLINGS Markus Franciscus Antonius ; VAN GREEVENBROEK Hendrikus Robertus Marie ; ENDENDIJK Wilfred Edward ; TINNEMANS Patricius Aloysius Jacobus ; MULDER Heine Melle ; BASELMANS Johannes Jacobus Matheus ; ENGELEN Adrianus Franciscus Petrus ; VAN DER VEEN Paul</creator><creatorcontrib>EURLINGS Markus Franciscus Antonius ; VAN GREEVENBROEK Hendrikus Robertus Marie ; ENDENDIJK Wilfred Edward ; TINNEMANS Patricius Aloysius Jacobus ; MULDER Heine Melle ; BASELMANS Johannes Jacobus Matheus ; ENGELEN Adrianus Franciscus Petrus ; VAN DER VEEN Paul</creatorcontrib><description>A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable elements and associated optical components of the illumination system to convert the radiation beam into a desired illumination mode, the controlling including allocating different individually controllable elements to different parts of the illumination mode in accordance with an allocation scheme, the allocation scheme selected to provide a desired modification of one or more properties of the illumination mode, the radiation beam or both. The method also includes patterning the radiation beam having the desired illumination mode with a pattern in its cross-section to form a patterned beam of radiation, and projecting the patterned radiation beam onto a target portion of a substrate.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20171102&amp;DB=EPODOC&amp;CC=US&amp;NR=2017315450A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20171102&amp;DB=EPODOC&amp;CC=US&amp;NR=2017315450A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>EURLINGS Markus Franciscus Antonius</creatorcontrib><creatorcontrib>VAN GREEVENBROEK Hendrikus Robertus Marie</creatorcontrib><creatorcontrib>ENDENDIJK Wilfred Edward</creatorcontrib><creatorcontrib>TINNEMANS Patricius Aloysius Jacobus</creatorcontrib><creatorcontrib>MULDER Heine Melle</creatorcontrib><creatorcontrib>BASELMANS Johannes Jacobus Matheus</creatorcontrib><creatorcontrib>ENGELEN Adrianus Franciscus Petrus</creatorcontrib><creatorcontrib>VAN DER VEEN Paul</creatorcontrib><title>LITHOGRAPHIC APPARATUS AND METHOD</title><description>A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable elements and associated optical components of the illumination system to convert the radiation beam into a desired illumination mode, the controlling including allocating different individually controllable elements to different parts of the illumination mode in accordance with an allocation scheme, the allocation scheme selected to provide a desired modification of one or more properties of the illumination mode, the radiation beam or both. The method also includes patterning the radiation beam having the desired illumination mode with a pattern in its cross-section to form a patterned beam of radiation, and projecting the patterned radiation beam onto a target portion of a substrate.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD08Qzx8HcPcgzw8HRWcAwIcAxyDAkNVnD0c1HwdQVKufAwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ3NjQ1MTUwNHQ2PiVAEAotAjFw</recordid><startdate>20171102</startdate><enddate>20171102</enddate><creator>EURLINGS Markus Franciscus Antonius</creator><creator>VAN GREEVENBROEK Hendrikus Robertus Marie</creator><creator>ENDENDIJK Wilfred Edward</creator><creator>TINNEMANS Patricius Aloysius Jacobus</creator><creator>MULDER Heine Melle</creator><creator>BASELMANS Johannes Jacobus Matheus</creator><creator>ENGELEN Adrianus Franciscus Petrus</creator><creator>VAN DER VEEN Paul</creator><scope>EVB</scope></search><sort><creationdate>20171102</creationdate><title>LITHOGRAPHIC APPARATUS AND METHOD</title><author>EURLINGS Markus Franciscus Antonius ; VAN GREEVENBROEK Hendrikus Robertus Marie ; ENDENDIJK Wilfred Edward ; TINNEMANS Patricius Aloysius Jacobus ; MULDER Heine Melle ; BASELMANS Johannes Jacobus Matheus ; ENGELEN Adrianus Franciscus Petrus ; VAN DER VEEN Paul</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2017315450A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>EURLINGS Markus Franciscus Antonius</creatorcontrib><creatorcontrib>VAN GREEVENBROEK Hendrikus Robertus Marie</creatorcontrib><creatorcontrib>ENDENDIJK Wilfred Edward</creatorcontrib><creatorcontrib>TINNEMANS Patricius Aloysius Jacobus</creatorcontrib><creatorcontrib>MULDER Heine Melle</creatorcontrib><creatorcontrib>BASELMANS Johannes Jacobus Matheus</creatorcontrib><creatorcontrib>ENGELEN Adrianus Franciscus Petrus</creatorcontrib><creatorcontrib>VAN DER VEEN Paul</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>EURLINGS Markus Franciscus Antonius</au><au>VAN GREEVENBROEK Hendrikus Robertus Marie</au><au>ENDENDIJK Wilfred Edward</au><au>TINNEMANS Patricius Aloysius Jacobus</au><au>MULDER Heine Melle</au><au>BASELMANS Johannes Jacobus Matheus</au><au>ENGELEN Adrianus Franciscus Petrus</au><au>VAN DER VEEN Paul</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LITHOGRAPHIC APPARATUS AND METHOD</title><date>2017-11-02</date><risdate>2017</risdate><abstract>A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable elements and associated optical components of the illumination system to convert the radiation beam into a desired illumination mode, the controlling including allocating different individually controllable elements to different parts of the illumination mode in accordance with an allocation scheme, the allocation scheme selected to provide a desired modification of one or more properties of the illumination mode, the radiation beam or both. The method also includes patterning the radiation beam having the desired illumination mode with a pattern in its cross-section to form a patterned beam of radiation, and projecting the patterned radiation beam onto a target portion of a substrate.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2017315450A1
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title LITHOGRAPHIC APPARATUS AND METHOD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T00%3A18%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=EURLINGS%20Markus%20Franciscus%20Antonius&rft.date=2017-11-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2017315450A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true