Method of Manufacturing Molded Semiconductor Packages Having an Optical Inspection Feature
A molded semiconductor package includes a mold compound having opposing first and second main surfaces and an edge extending between the first and second main surfaces. A semiconductor die is embedded in the mold compound. A plurality of metal pads are also embedded in the mold compound and electric...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Soriano Aileen Manantan Muhammat Sanusi Muhammad Lee Swee Kah Ng Mei Chin Goh Soon Lock Lum Fong Mei Chong Hock Heng |
description | A molded semiconductor package includes a mold compound having opposing first and second main surfaces and an edge extending between the first and second main surfaces. A semiconductor die is embedded in the mold compound. A plurality of metal pads are also embedded in the mold compound and electrically connected to the semiconductor die. The metal pads have a bottom face which is uncovered by the mold compound at the second main surface of the mold compound. The metal pads disposed around a periphery of the molded package have a side face which is uncovered by the mold compound at the edge of the mold compound. The faces of the metal pads uncovered by the mold compound are plated. The side face of each metal pad disposed around the periphery of the molded package is recessed inward from the edge of the mold compound. A corresponding manufacturing method is also described. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2017256509A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2017256509A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2017256509A13</originalsourceid><addsrcrecordid>eNqNzMEKgkAQgGEvHaJ6h4HOgRomHSMSO0iBdekiw-xoSzazuGvPX0EP0Om_fPzT6FZxuKsBbaFCGVukMA5WOqi0N2yg5qclFTNS0AHOSA_s2EOJry9CgZMLlrCHo3jHFKwKFIyfCc-jSYu958Wvs2hZHC77csVOG_YOiYVDc63TOMnTbJPF212y_k-9AenSO7w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of Manufacturing Molded Semiconductor Packages Having an Optical Inspection Feature</title><source>esp@cenet</source><creator>Soriano Aileen Manantan ; Muhammat Sanusi Muhammad ; Lee Swee Kah ; Ng Mei Chin ; Goh Soon Lock ; Lum Fong Mei ; Chong Hock Heng</creator><creatorcontrib>Soriano Aileen Manantan ; Muhammat Sanusi Muhammad ; Lee Swee Kah ; Ng Mei Chin ; Goh Soon Lock ; Lum Fong Mei ; Chong Hock Heng</creatorcontrib><description>A molded semiconductor package includes a mold compound having opposing first and second main surfaces and an edge extending between the first and second main surfaces. A semiconductor die is embedded in the mold compound. A plurality of metal pads are also embedded in the mold compound and electrically connected to the semiconductor die. The metal pads have a bottom face which is uncovered by the mold compound at the second main surface of the mold compound. The metal pads disposed around a periphery of the molded package have a side face which is uncovered by the mold compound at the edge of the mold compound. The faces of the metal pads uncovered by the mold compound are plated. The side face of each metal pad disposed around the periphery of the molded package is recessed inward from the edge of the mold compound. A corresponding manufacturing method is also described.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170907&DB=EPODOC&CC=US&NR=2017256509A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170907&DB=EPODOC&CC=US&NR=2017256509A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Soriano Aileen Manantan</creatorcontrib><creatorcontrib>Muhammat Sanusi Muhammad</creatorcontrib><creatorcontrib>Lee Swee Kah</creatorcontrib><creatorcontrib>Ng Mei Chin</creatorcontrib><creatorcontrib>Goh Soon Lock</creatorcontrib><creatorcontrib>Lum Fong Mei</creatorcontrib><creatorcontrib>Chong Hock Heng</creatorcontrib><title>Method of Manufacturing Molded Semiconductor Packages Having an Optical Inspection Feature</title><description>A molded semiconductor package includes a mold compound having opposing first and second main surfaces and an edge extending between the first and second main surfaces. A semiconductor die is embedded in the mold compound. A plurality of metal pads are also embedded in the mold compound and electrically connected to the semiconductor die. The metal pads have a bottom face which is uncovered by the mold compound at the second main surface of the mold compound. The metal pads disposed around a periphery of the molded package have a side face which is uncovered by the mold compound at the edge of the mold compound. The faces of the metal pads uncovered by the mold compound are plated. The side face of each metal pad disposed around the periphery of the molded package is recessed inward from the edge of the mold compound. A corresponding manufacturing method is also described.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzMEKgkAQgGEvHaJ6h4HOgRomHSMSO0iBdekiw-xoSzazuGvPX0EP0Om_fPzT6FZxuKsBbaFCGVukMA5WOqi0N2yg5qclFTNS0AHOSA_s2EOJry9CgZMLlrCHo3jHFKwKFIyfCc-jSYu958Wvs2hZHC77csVOG_YOiYVDc63TOMnTbJPF212y_k-9AenSO7w</recordid><startdate>20170907</startdate><enddate>20170907</enddate><creator>Soriano Aileen Manantan</creator><creator>Muhammat Sanusi Muhammad</creator><creator>Lee Swee Kah</creator><creator>Ng Mei Chin</creator><creator>Goh Soon Lock</creator><creator>Lum Fong Mei</creator><creator>Chong Hock Heng</creator><scope>EVB</scope></search><sort><creationdate>20170907</creationdate><title>Method of Manufacturing Molded Semiconductor Packages Having an Optical Inspection Feature</title><author>Soriano Aileen Manantan ; Muhammat Sanusi Muhammad ; Lee Swee Kah ; Ng Mei Chin ; Goh Soon Lock ; Lum Fong Mei ; Chong Hock Heng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2017256509A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Soriano Aileen Manantan</creatorcontrib><creatorcontrib>Muhammat Sanusi Muhammad</creatorcontrib><creatorcontrib>Lee Swee Kah</creatorcontrib><creatorcontrib>Ng Mei Chin</creatorcontrib><creatorcontrib>Goh Soon Lock</creatorcontrib><creatorcontrib>Lum Fong Mei</creatorcontrib><creatorcontrib>Chong Hock Heng</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Soriano Aileen Manantan</au><au>Muhammat Sanusi Muhammad</au><au>Lee Swee Kah</au><au>Ng Mei Chin</au><au>Goh Soon Lock</au><au>Lum Fong Mei</au><au>Chong Hock Heng</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of Manufacturing Molded Semiconductor Packages Having an Optical Inspection Feature</title><date>2017-09-07</date><risdate>2017</risdate><abstract>A molded semiconductor package includes a mold compound having opposing first and second main surfaces and an edge extending between the first and second main surfaces. A semiconductor die is embedded in the mold compound. A plurality of metal pads are also embedded in the mold compound and electrically connected to the semiconductor die. The metal pads have a bottom face which is uncovered by the mold compound at the second main surface of the mold compound. The metal pads disposed around a periphery of the molded package have a side face which is uncovered by the mold compound at the edge of the mold compound. The faces of the metal pads uncovered by the mold compound are plated. The side face of each metal pad disposed around the periphery of the molded package is recessed inward from the edge of the mold compound. A corresponding manufacturing method is also described.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2017256509A1 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Method of Manufacturing Molded Semiconductor Packages Having an Optical Inspection Feature |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T19%3A16%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Soriano%20Aileen%20Manantan&rft.date=2017-09-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2017256509A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |