AUTOMATED TEM SAMPLE PREPARATION

Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Routh, JR. Brian Roberts, Trivedi Dhruti, Young Richard J, Miller Thomas G, Stone Stacey, Brogden Valerie, Blackwood Jeffrey, Schmidt Michael, Templeton Todd
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
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