METHOD AND APPARATUS FOR ULTRASENSITIVE QUANTIFICATION OF MICRORNA

The present invention provides an apparatus and a method for detecting the presence of and/or determining the amount of a label-free microRNA using an atomic force microscope. The method is extremely selective and/or ultrasensitive. In particular, the present invention provides a cantilever comprisi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Lee Yoon Hee, Kim Young Kyu, Kim Joung Hun, Park Joon Won, Koo Hyun Seo
Format: Patent
Sprache:eng
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