METHOD OF PLASMA ETCHING AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
Disclosed are a method of plasma etching and a method of fabricating a semiconductor device including the same. The method of plasma etching includes loading a substrate including an etch target onto a first electrode in a chamber, the chamber including the first electrode and a second electrode arr...
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creator | Sung Dougyong Cho Junghyun Choi Myungsun PARK Hoyong Shim Seungbo Kang Namjun |
description | Disclosed are a method of plasma etching and a method of fabricating a semiconductor device including the same. The method of plasma etching includes loading a substrate including an etch target onto a first electrode in a chamber, the chamber including the first electrode and a second electrode arranged to face each other, and etching the target. The etching the target includes applying a plurality of RF powers to one of the first and second electrodes. The plurality of RF powers may include a first RF power having a first frequency in a range from about 40 MHz to about 300 MHz, a second RF power having a second frequency in a range from about 100 kHz to about 10 MHz, and a third RF power having a third frequency in a range from about 10 kHz to about 5 MHz. |
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The plurality of RF powers may include a first RF power having a first frequency in a range from about 40 MHz to about 300 MHz, a second RF power having a second frequency in a range from about 100 kHz to about 10 MHz, and a third RF power having a third frequency in a range from about 10 kHz to about 5 MHz.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170810&DB=EPODOC&CC=US&NR=2017229312A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170810&DB=EPODOC&CC=US&NR=2017229312A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Sung Dougyong</creatorcontrib><creatorcontrib>Cho Junghyun</creatorcontrib><creatorcontrib>Choi Myungsun</creatorcontrib><creatorcontrib>PARK Hoyong</creatorcontrib><creatorcontrib>Shim Seungbo</creatorcontrib><creatorcontrib>Kang Namjun</creatorcontrib><title>METHOD OF PLASMA ETCHING AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME</title><description>Disclosed are a method of plasma etching and a method of fabricating a semiconductor device including the same. 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The plurality of RF powers may include a first RF power having a first frequency in a range from about 40 MHz to about 300 MHz, a second RF power having a second frequency in a range from about 100 kHz to about 10 MHz, and a third RF power having a third frequency in a range from about 10 kHz to about 5 MHz.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAjzdQ3x8HdR8HdTCPBxDPZ1VHANcfbw9HNXcPRzUUBIujk6BXk6O4aAZIJdfT2d_f1cQp1D_IMUXFzDPJ1dFUKDQVIhHq4KwY6-rjwMrGmJOcWpvFCam0HZDWSwbmpBfnxqcUFicmpeakl8aLCRgaG5kZGlsaGRo6ExcaoADZgxIA</recordid><startdate>20170810</startdate><enddate>20170810</enddate><creator>Sung Dougyong</creator><creator>Cho Junghyun</creator><creator>Choi Myungsun</creator><creator>PARK Hoyong</creator><creator>Shim Seungbo</creator><creator>Kang Namjun</creator><scope>EVB</scope></search><sort><creationdate>20170810</creationdate><title>METHOD OF PLASMA ETCHING AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME</title><author>Sung Dougyong ; Cho Junghyun ; Choi Myungsun ; PARK Hoyong ; Shim Seungbo ; Kang Namjun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2017229312A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Sung Dougyong</creatorcontrib><creatorcontrib>Cho Junghyun</creatorcontrib><creatorcontrib>Choi Myungsun</creatorcontrib><creatorcontrib>PARK Hoyong</creatorcontrib><creatorcontrib>Shim Seungbo</creatorcontrib><creatorcontrib>Kang Namjun</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sung Dougyong</au><au>Cho Junghyun</au><au>Choi Myungsun</au><au>PARK Hoyong</au><au>Shim Seungbo</au><au>Kang Namjun</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF PLASMA ETCHING AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME</title><date>2017-08-10</date><risdate>2017</risdate><abstract>Disclosed are a method of plasma etching and a method of fabricating a semiconductor device including the same. 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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | METHOD OF PLASMA ETCHING AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME |
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