DEVICE DEGRADATION CAUSE ESTIMATION METHOD AND DEVICE

A degradation cause estimation device is provided with a degradation detector for detecting the amount of degradation undergone by a device, a state observation device for detecting observation values for internal portions, values observed from outside, or device control and operation information, a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YUDA Shinya, SAEKI Takashi, UNUMA Munetoshi
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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