METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR

An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel i...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Maurer Christian, Ollinger Christoph, Meding Olaf, He Bob Baoping
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Maurer Christian
Ollinger Christoph
Meding Olaf
He Bob Baoping
description An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2017176355A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2017176355A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2017176355A13</originalsourceid><addsrcrecordid>eNqNzL0KwjAUhuEuDqLewwHngrXUzof8mECbA8kprYulSJxEC_X-MYIX4PQN78O3zq6tYkMSNHkQ1DRKsHVnQCE6j6xgyD1eQFqtPaZEDiQyQm_ZAEIQ6NzXc0-5tK1yIRFsQCpOT-S32eo-PZa4--0m22vFwuRxfo1xmadbfMb32IXjoaiL-lRWFRblf-oDx4czrQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR</title><source>esp@cenet</source><creator>Maurer Christian ; Ollinger Christoph ; Meding Olaf ; He Bob Baoping</creator><creatorcontrib>Maurer Christian ; Ollinger Christoph ; Meding Olaf ; He Bob Baoping</creatorcontrib><description>An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170622&amp;DB=EPODOC&amp;CC=US&amp;NR=2017176355A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170622&amp;DB=EPODOC&amp;CC=US&amp;NR=2017176355A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Maurer Christian</creatorcontrib><creatorcontrib>Ollinger Christoph</creatorcontrib><creatorcontrib>Meding Olaf</creatorcontrib><creatorcontrib>He Bob Baoping</creatorcontrib><title>METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR</title><description>An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzL0KwjAUhuEuDqLewwHngrXUzof8mECbA8kprYulSJxEC_X-MYIX4PQN78O3zq6tYkMSNHkQ1DRKsHVnQCE6j6xgyD1eQFqtPaZEDiQyQm_ZAEIQ6NzXc0-5tK1yIRFsQCpOT-S32eo-PZa4--0m22vFwuRxfo1xmadbfMb32IXjoaiL-lRWFRblf-oDx4czrQ</recordid><startdate>20170622</startdate><enddate>20170622</enddate><creator>Maurer Christian</creator><creator>Ollinger Christoph</creator><creator>Meding Olaf</creator><creator>He Bob Baoping</creator><scope>EVB</scope></search><sort><creationdate>20170622</creationdate><title>METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR</title><author>Maurer Christian ; Ollinger Christoph ; Meding Olaf ; He Bob Baoping</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2017176355A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Maurer Christian</creatorcontrib><creatorcontrib>Ollinger Christoph</creatorcontrib><creatorcontrib>Meding Olaf</creatorcontrib><creatorcontrib>He Bob Baoping</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Maurer Christian</au><au>Ollinger Christoph</au><au>Meding Olaf</au><au>He Bob Baoping</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR</title><date>2017-06-22</date><risdate>2017</risdate><abstract>An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2017176355A1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T12%3A40%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Maurer%20Christian&rft.date=2017-06-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2017176355A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true