ELECTROMIGRATION-AWARE INTEGRATED CIRCUIT DESIGN METHODS AND SYSTEMS

Disclosed are electromigration (EM)-aware integrated circuit (IC) design techniques, which consider EM early in the IC design process in order to generate, in a timely manner, an IC design that can be used to manufacture IC chips that will exhibit minimal EM fails for improved IC reliability. Specif...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Bickford Jeanne P, Chandra Alok, Kumaraswamy Anand, Prajapati Sandeep, Prudvi Venkatasreekanth
Format: Patent
Sprache:eng
Schlagworte:
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