POWER STATE COVERAGE METRIC AND METHOD FOR ESTIMATING THE SAME

In some embodiments, in a method performed by at least one processor for estimating an overall power state coverage of an electronic system level (ESL) model comprising a plurality of blocks for a module, a first value and a second value are set for each block of said plurality of blocks. At least o...

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Bibliographische Detailangaben
Hauptverfasser: HUANG TZEIANG, JOHN STANLEY, GOEL SANDEEP KUMAR, LEE YUN-HAN
Format: Patent
Sprache:eng
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