PATTERN FORMING METHOD

A pattern forming method includes forming a guide mask layer including a first feature having a first opening width, a second feature having a second opening width, a third feature having a third opening width. The first width being less than the second width and greater than the third width. A self...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KAWANISHI Ayako, KASAHARA Yusuke, YONEMITSU Hiroki
Format: Patent
Sprache:eng
Schlagworte:
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