FIXTURE TO SUPPORT REEL-TO-REEL INSPECTION OF SEMICONDUCTOR DEVICES OR OTHER COMPONENTS

A system includes a component inspection system having a radiation source configured to generate radiation and a radiation detector configured to detect the radiation after the radiation passes through components to be inspected. The system also includes a fixture configured to receive multiple reel...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Fasolino Stephen T, Ng Joshua, Wheeler Jason L
Format:	Patent
Sprache:	eng
Schlagworte:	CONVEYING DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS HANDLING THIN OR FILAMENTARY MATERIAL HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PACKING PERFORMING OPERATIONS PHYSICS STORING TESTING TRANSPORTING
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