LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS AND METHODS

LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS AND METHODS

Systems and methods for testing semiconductor wafers using a wafer translator are disclosed herein. In one embodiment, an apparatus for testing semiconductor dies includes a semiconductor wafer translator having a wafer-side positioned to face toward a device under test, and an inquiry-side facing a...

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Hauptverfasser: Lane Christopher T, Buck Doug, Johnson Morgan T, Gardiner Mark, Preston Douglas A, Kalnin Nikolai
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator Lane Christopher T
Buck Doug
Johnson Morgan T
Gardiner Mark
Preston Douglas A
Kalnin Nikolai
description Systems and methods for testing semiconductor wafers using a wafer translator are disclosed herein. In one embodiment, an apparatus for testing semiconductor dies includes a semiconductor wafer translator having a wafer-side positioned to face toward a device under test, and an inquiry-side facing away from the wafer-side. The apparatus also includes a flexible arm peripherally connected to the wafer translator, and an evacuation opening within the flexible arm or within the wafer translator. The evacuation opening is open to a flow of a gas in a first position of the flexible arm, and closed to a flow of the gas in a second position of the flexible arm.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS AND METHODS
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