TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD
A test interface board includes an encoder, a signal copier, and a decoder. The encoder digitally encodes test data to generate a modulation signal. The signal copier copies the modulation signal by inductively coupling the modulation signal and outputs at least one copy signal corresponding to the...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | SONG Ki-jae JANG Ung-jin YUN Joo-sung CHOI Woon-sup KIM Jae-hyun |
description | A test interface board includes an encoder, a signal copier, and a decoder. The encoder digitally encodes test data to generate a modulation signal. The signal copier copies the modulation signal by inductively coupling the modulation signal and outputs at least one copy signal corresponding to the modulation signal. The decoder decodes the modulation signal and the at least one copy signal in order to test at least two semiconductor devices. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2017023638A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2017023638A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2017023638A13</originalsourceid><addsrcrecordid>eNrjZLAIcQ0OUXDydwxy0VEAs10DQz0DfF39QqD84MjgEFdfHQVHPxeIgK9riIe_Cw8Da1piTnEqL5TmZlB2cw1x9tBNLciPTy0uSExOzUstiQ8NNjIwNDcwMjYztnA0NCZOFQDsEikw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD</title><source>esp@cenet</source><creator>SONG Ki-jae ; JANG Ung-jin ; YUN Joo-sung ; CHOI Woon-sup ; KIM Jae-hyun</creator><creatorcontrib>SONG Ki-jae ; JANG Ung-jin ; YUN Joo-sung ; CHOI Woon-sup ; KIM Jae-hyun</creatorcontrib><description>A test interface board includes an encoder, a signal copier, and a decoder. The encoder digitally encodes test data to generate a modulation signal. The signal copier copies the modulation signal by inductively coupling the modulation signal and outputs at least one copy signal corresponding to the modulation signal. The decoder decodes the modulation signal and the at least one copy signal in order to test at least two semiconductor devices.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170126&DB=EPODOC&CC=US&NR=2017023638A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170126&DB=EPODOC&CC=US&NR=2017023638A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SONG Ki-jae</creatorcontrib><creatorcontrib>JANG Ung-jin</creatorcontrib><creatorcontrib>YUN Joo-sung</creatorcontrib><creatorcontrib>CHOI Woon-sup</creatorcontrib><creatorcontrib>KIM Jae-hyun</creatorcontrib><title>TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD</title><description>A test interface board includes an encoder, a signal copier, and a decoder. The encoder digitally encodes test data to generate a modulation signal. The signal copier copies the modulation signal by inductively coupling the modulation signal and outputs at least one copy signal corresponding to the modulation signal. The decoder decodes the modulation signal and the at least one copy signal in order to test at least two semiconductor devices.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAIcQ0OUXDydwxy0VEAs10DQz0DfF39QqD84MjgEFdfHQVHPxeIgK9riIe_Cw8Da1piTnEqL5TmZlB2cw1x9tBNLciPTy0uSExOzUstiQ8NNjIwNDcwMjYztnA0NCZOFQDsEikw</recordid><startdate>20170126</startdate><enddate>20170126</enddate><creator>SONG Ki-jae</creator><creator>JANG Ung-jin</creator><creator>YUN Joo-sung</creator><creator>CHOI Woon-sup</creator><creator>KIM Jae-hyun</creator><scope>EVB</scope></search><sort><creationdate>20170126</creationdate><title>TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD</title><author>SONG Ki-jae ; JANG Ung-jin ; YUN Joo-sung ; CHOI Woon-sup ; KIM Jae-hyun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2017023638A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SONG Ki-jae</creatorcontrib><creatorcontrib>JANG Ung-jin</creatorcontrib><creatorcontrib>YUN Joo-sung</creatorcontrib><creatorcontrib>CHOI Woon-sup</creatorcontrib><creatorcontrib>KIM Jae-hyun</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SONG Ki-jae</au><au>JANG Ung-jin</au><au>YUN Joo-sung</au><au>CHOI Woon-sup</au><au>KIM Jae-hyun</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD</title><date>2017-01-26</date><risdate>2017</risdate><abstract>A test interface board includes an encoder, a signal copier, and a decoder. The encoder digitally encodes test data to generate a modulation signal. The signal copier copies the modulation signal by inductively coupling the modulation signal and outputs at least one copy signal corresponding to the modulation signal. The decoder decodes the modulation signal and the at least one copy signal in order to test at least two semiconductor devices.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2017023638A1 |
source | esp@cenet |
subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T03%3A51%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SONG%20Ki-jae&rft.date=2017-01-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2017023638A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |