PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS

A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferomete...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Young Brenton C, Black Adam T, Gustavson Todd L
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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