PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS
A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferomete...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Young Brenton C Black Adam T Gustavson Todd L |
| description | A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first cloud and atoms in the second cloud. The first cloud of atoms and the second cloud of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first cloud of atoms or the second cloud of atoms. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2017016710A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2017016710A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2017016710A13</originalsourceid><addsrcrecordid>eNrjZNAO8HAMdlVw9vcLCfL3UXDzD1JwCXX0UXAM8fdV8PQLcQ1ycw3y93UFMoJ5GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgaG5gaGZuaGBo6ExcaoADl0l5g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS</title><source>esp@cenet</source><creator>Young Brenton C ; Black Adam T ; Gustavson Todd L</creator><creatorcontrib>Young Brenton C ; Black Adam T ; Gustavson Todd L</creatorcontrib><description>A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first cloud and atoms in the second cloud. The first cloud of atoms and the second cloud of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first cloud of atoms or the second cloud of atoms.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170119&DB=EPODOC&CC=US&NR=2017016710A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170119&DB=EPODOC&CC=US&NR=2017016710A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Young Brenton C</creatorcontrib><creatorcontrib>Black Adam T</creatorcontrib><creatorcontrib>Gustavson Todd L</creatorcontrib><title>PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS</title><description>A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first cloud and atoms in the second cloud. The first cloud of atoms and the second cloud of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first cloud of atoms or the second cloud of atoms.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAO8HAMdlVw9vcLCfL3UXDzD1JwCXX0UXAM8fdV8PQLcQ1ycw3y93UFMoJ5GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgaG5gaGZuaGBo6ExcaoADl0l5g</recordid><startdate>20170119</startdate><enddate>20170119</enddate><creator>Young Brenton C</creator><creator>Black Adam T</creator><creator>Gustavson Todd L</creator><scope>EVB</scope></search><sort><creationdate>20170119</creationdate><title>PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS</title><author>Young Brenton C ; Black Adam T ; Gustavson Todd L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2017016710A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Young Brenton C</creatorcontrib><creatorcontrib>Black Adam T</creatorcontrib><creatorcontrib>Gustavson Todd L</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Young Brenton C</au><au>Black Adam T</au><au>Gustavson Todd L</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS</title><date>2017-01-19</date><risdate>2017</risdate><abstract>A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first cloud and atoms in the second cloud. The first cloud of atoms and the second cloud of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first cloud of atoms or the second cloud of atoms.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2017016710A1 |
| source | esp@cenet |
| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | PHASE CONTROL FOR DUAL ATOM INTERFEROMETERS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T01%3A18%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Young%20Brenton%20C&rft.date=2017-01-19&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2017016710A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |