NON-SCANNING SPR SYSTEM

NON-SCANNING SPR SYSTEM

A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a r...

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Hauptverfasser: BARAK Itay, RAN Boaz
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator BARAK Itay
RAN Boaz
description A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence; c) a detector which responds differently to an intensity of light received by it at different locations; and d) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2016356712A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2016356712A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2016356712A13</originalsourceid><addsrcrecordid>eNrjZBD38_fTDXZ29PPz9HNXCA4IUgiODA5x9eVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhmbGpmbmhkaOhsbEqQIAW9Egdw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>NON-SCANNING SPR SYSTEM</title><source>esp@cenet</source><creator>BARAK Itay ; RAN Boaz</creator><creatorcontrib>BARAK Itay ; RAN Boaz</creatorcontrib><description>A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence; c) a detector which responds differently to an intensity of light received by it at different locations; and d) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161208&amp;DB=EPODOC&amp;CC=US&amp;NR=2016356712A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161208&amp;DB=EPODOC&amp;CC=US&amp;NR=2016356712A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BARAK Itay</creatorcontrib><creatorcontrib>RAN Boaz</creatorcontrib><title>NON-SCANNING SPR SYSTEM</title><description>A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence; c) a detector which responds differently to an intensity of light received by it at different locations; and d) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD38_fTDXZ29PPz9HNXCA4IUgiODA5x9eVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhmbGpmbmhkaOhsbEqQIAW9Egdw</recordid><startdate>20161208</startdate><enddate>20161208</enddate><creator>BARAK Itay</creator><creator>RAN Boaz</creator><scope>EVB</scope></search><sort><creationdate>20161208</creationdate><title>NON-SCANNING SPR SYSTEM</title><author>BARAK Itay ; RAN Boaz</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2016356712A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BARAK Itay</creatorcontrib><creatorcontrib>RAN Boaz</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BARAK Itay</au><au>RAN Boaz</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>NON-SCANNING SPR SYSTEM</title><date>2016-12-08</date><risdate>2016</risdate><abstract>A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence; c) a detector which responds differently to an intensity of light received by it at different locations; and d) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title NON-SCANNING SPR SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T09%3A51%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BARAK%20Itay&rft.date=2016-12-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2016356712A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true