EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS
Efficient production testing of integrated circuits (ICs). A first production test is implemented on a group of ICs and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that ICs having a recoverable fail and ICs having a non-recoverable fail a...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | Efficient production testing of integrated circuits (ICs). A first production test is implemented on a group of ICs and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that ICs having a recoverable fail and ICs having a non-recoverable fail are differentiated. The ICs are integrated based on the analyzed results and a second production test is implemented. The second production test tests the ICs responsive to the segregation, such that the second production test is limited only to ICs with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having ICs not to be re-tested. |
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