PARTICLE DETECTOR
A particle detector that includes an inspection light source that irradiates a flow cell with inspection light, the flow cell that allows a fluid containing a particle to flow therethrough, the flow cell including a semispherical reflective film that reflects reaction light generated by the particle...
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creator | OBARA Daisuke FURUYA Masashi |
description | A particle detector that includes an inspection light source that irradiates a flow cell with inspection light, the flow cell that allows a fluid containing a particle to flow therethrough, the flow cell including a semispherical reflective film that reflects reaction light generated by the particle irradiated with the inspection light, and a semispherical lens portion through which the reaction light reflected by the semispherical reflective film passes, an elliptical mirror that has a first focus at a position of the flow cell, and that reflects the reaction light having passed through the semispherical lens portion of the flow cell, and an optical detector that is disposed at a second focus of the elliptical mirror and that detects the reaction light reflected by the elliptical mirror. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2016238512A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2016238512A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2016238512A13</originalsourceid><addsrcrecordid>eNrjZBAMcAwK8XT2cVVwcQ1xdQ7xD-JhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhmZGxhamhkaOhsbEqQIAmHEetg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PARTICLE DETECTOR</title><source>esp@cenet</source><creator>OBARA Daisuke ; FURUYA Masashi</creator><creatorcontrib>OBARA Daisuke ; FURUYA Masashi</creatorcontrib><description>A particle detector that includes an inspection light source that irradiates a flow cell with inspection light, the flow cell that allows a fluid containing a particle to flow therethrough, the flow cell including a semispherical reflective film that reflects reaction light generated by the particle irradiated with the inspection light, and a semispherical lens portion through which the reaction light reflected by the semispherical reflective film passes, an elliptical mirror that has a first focus at a position of the flow cell, and that reflects the reaction light having passed through the semispherical lens portion of the flow cell, and an optical detector that is disposed at a second focus of the elliptical mirror and that detects the reaction light reflected by the elliptical mirror.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160818&DB=EPODOC&CC=US&NR=2016238512A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160818&DB=EPODOC&CC=US&NR=2016238512A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OBARA Daisuke</creatorcontrib><creatorcontrib>FURUYA Masashi</creatorcontrib><title>PARTICLE DETECTOR</title><description>A particle detector that includes an inspection light source that irradiates a flow cell with inspection light, the flow cell that allows a fluid containing a particle to flow therethrough, the flow cell including a semispherical reflective film that reflects reaction light generated by the particle irradiated with the inspection light, and a semispherical lens portion through which the reaction light reflected by the semispherical reflective film passes, an elliptical mirror that has a first focus at a position of the flow cell, and that reflects the reaction light having passed through the semispherical lens portion of the flow cell, and an optical detector that is disposed at a second focus of the elliptical mirror and that detects the reaction light reflected by the elliptical mirror.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAMcAwK8XT2cVVwcQ1xdQ7xD-JhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhmZGxhamhkaOhsbEqQIAmHEetg</recordid><startdate>20160818</startdate><enddate>20160818</enddate><creator>OBARA Daisuke</creator><creator>FURUYA Masashi</creator><scope>EVB</scope></search><sort><creationdate>20160818</creationdate><title>PARTICLE DETECTOR</title><author>OBARA Daisuke ; FURUYA Masashi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2016238512A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OBARA Daisuke</creatorcontrib><creatorcontrib>FURUYA Masashi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OBARA Daisuke</au><au>FURUYA Masashi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PARTICLE DETECTOR</title><date>2016-08-18</date><risdate>2016</risdate><abstract>A particle detector that includes an inspection light source that irradiates a flow cell with inspection light, the flow cell that allows a fluid containing a particle to flow therethrough, the flow cell including a semispherical reflective film that reflects reaction light generated by the particle irradiated with the inspection light, and a semispherical lens portion through which the reaction light reflected by the semispherical reflective film passes, an elliptical mirror that has a first focus at a position of the flow cell, and that reflects the reaction light having passed through the semispherical lens portion of the flow cell, and an optical detector that is disposed at a second focus of the elliptical mirror and that detects the reaction light reflected by the elliptical mirror.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | PARTICLE DETECTOR |
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