SYSTEM, METHOD AND FIXTURE FOR PERFORMING BOTH OPTICAL POWER AND WAVELENGTH MEASUREMENTS OF LIGHT EMITTED FROM A LASER DIODE

A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously...

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Bibliographische Detailangaben

Hauptverfasser:	CHANG HUNG-LUN, LUO GUIPENG, ANSELM KLAUS ALEXANDER
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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