MEASURING HEAD FOR NANOINDENTATION INSTRUMENT AND MEASURING METHOD

A measuring head for a nano-indentation instrument, said nano-indentation instrument comprising a positioning system arranged to position a sample relative to the measuring head, the measuring head comprising: a measuring subsystem attached to a frame adapted to be connected to the nano-indentation...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	BELLATON BERTRAND, CONSIGLIO RICHARD, WOIRGARD JACQUES
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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