TEST PROBE, TEST PROBE COMPONENT AND TEST PLATFORM

TEST PROBE, TEST PROBE COMPONENT AND TEST PLATFORM

The present invention discloses a test probe, a test probe component, and a test platform. The test probe comprises a probe body, wherein one end of the probe body is of a hollow design, thereby cooperating with a gold finger through insertion. According to the present invention, one end of the prob...

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1. Verfasser: NIE LINHONG
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator NIE LINHONG
description The present invention discloses a test probe, a test probe component, and a test platform. The test probe comprises a probe body, wherein one end of the probe body is of a hollow design, thereby cooperating with a gold finger through insertion. According to the present invention, one end of the probe body is of a hollow design, thereby cooperating with the gold finger through insertion, thus solving the current technical problems of the assembling of the probe being relatively difficult, the requirements for processing of the through-hole being relative high, and the powering on being unstable.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title TEST PROBE, TEST PROBE COMPONENT AND TEST PLATFORM
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