Apparatus and Method for Magnetic Sensor Based Surface Shape Analysis
A device has magnetic sensors and magnets in an array on a flexible substrate. Each magnetic sensor is sensitive to immediately proximate magnets. At least one controller evaluates magnetic sensor signals from the magnetic sensors produced in response to deformation of the flexible substrate.
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | CAMBOU BERTRAND F RISTIC LJUBISA STOKES TED LEE DOUGLAS WU JIAN MACKAY KEN |
| description | A device has magnetic sensors and magnets in an array on a flexible substrate. Each magnetic sensor is sensitive to immediately proximate magnets. At least one controller evaluates magnetic sensor signals from the magnetic sensors produced in response to deformation of the flexible substrate. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2016084674A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2016084674A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2016084674A13</originalsourceid><addsrcrecordid>eNrjZHB1LChILEosKS1WSMxLUfBNLcnIT1FIyy9S8E1Mz0styUxWCE7NKwbynRKLU1MUgkuL0hKTUxWCMxILUhUc8xJzKoszi3kYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxAVAH0Kz40GAjA0MzAwsTM3MTR0Nj4lQBAFa1M1c</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and Method for Magnetic Sensor Based Surface Shape Analysis</title><source>esp@cenet</source><creator>CAMBOU BERTRAND F ; RISTIC LJUBISA ; STOKES TED ; LEE DOUGLAS ; WU JIAN ; MACKAY KEN</creator><creatorcontrib>CAMBOU BERTRAND F ; RISTIC LJUBISA ; STOKES TED ; LEE DOUGLAS ; WU JIAN ; MACKAY KEN</creatorcontrib><description>A device has magnetic sensors and magnets in an array on a flexible substrate. Each magnetic sensor is sensitive to immediately proximate magnets. At least one controller evaluates magnetic sensor signals from the magnetic sensors produced in response to deformation of the flexible substrate.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160324&DB=EPODOC&CC=US&NR=2016084674A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160324&DB=EPODOC&CC=US&NR=2016084674A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAMBOU BERTRAND F</creatorcontrib><creatorcontrib>RISTIC LJUBISA</creatorcontrib><creatorcontrib>STOKES TED</creatorcontrib><creatorcontrib>LEE DOUGLAS</creatorcontrib><creatorcontrib>WU JIAN</creatorcontrib><creatorcontrib>MACKAY KEN</creatorcontrib><title>Apparatus and Method for Magnetic Sensor Based Surface Shape Analysis</title><description>A device has magnetic sensors and magnets in an array on a flexible substrate. Each magnetic sensor is sensitive to immediately proximate magnets. At least one controller evaluates magnetic sensor signals from the magnetic sensors produced in response to deformation of the flexible substrate.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB1LChILEosKS1WSMxLUfBNLcnIT1FIyy9S8E1Mz0styUxWCE7NKwbynRKLU1MUgkuL0hKTUxWCMxILUhUc8xJzKoszi3kYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxAVAH0Kz40GAjA0MzAwsTM3MTR0Nj4lQBAFa1M1c</recordid><startdate>20160324</startdate><enddate>20160324</enddate><creator>CAMBOU BERTRAND F</creator><creator>RISTIC LJUBISA</creator><creator>STOKES TED</creator><creator>LEE DOUGLAS</creator><creator>WU JIAN</creator><creator>MACKAY KEN</creator><scope>EVB</scope></search><sort><creationdate>20160324</creationdate><title>Apparatus and Method for Magnetic Sensor Based Surface Shape Analysis</title><author>CAMBOU BERTRAND F ; RISTIC LJUBISA ; STOKES TED ; LEE DOUGLAS ; WU JIAN ; MACKAY KEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2016084674A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CAMBOU BERTRAND F</creatorcontrib><creatorcontrib>RISTIC LJUBISA</creatorcontrib><creatorcontrib>STOKES TED</creatorcontrib><creatorcontrib>LEE DOUGLAS</creatorcontrib><creatorcontrib>WU JIAN</creatorcontrib><creatorcontrib>MACKAY KEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAMBOU BERTRAND F</au><au>RISTIC LJUBISA</au><au>STOKES TED</au><au>LEE DOUGLAS</au><au>WU JIAN</au><au>MACKAY KEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and Method for Magnetic Sensor Based Surface Shape Analysis</title><date>2016-03-24</date><risdate>2016</risdate><abstract>A device has magnetic sensors and magnets in an array on a flexible substrate. Each magnetic sensor is sensitive to immediately proximate magnets. At least one controller evaluates magnetic sensor signals from the magnetic sensors produced in response to deformation of the flexible substrate.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2016084674A1 |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | Apparatus and Method for Magnetic Sensor Based Surface Shape Analysis |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T12%3A43%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CAMBOU%20BERTRAND%20F&rft.date=2016-03-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2016084674A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |