METHOD TO IMPROVE STRAIN RATE CONTROL OF SMALL LEAD FREE PRINTED CIRCUIT BOARD ASSEMBLY DURING IN CIRCUIT TEST PROCESS
An apparatus includes a top plate and an extension card surrounding a space for a small electronic assembly. The extension card and small electronic assembly are mounted to the top plate. The apparatus includes a plurality of test probes extending through the top plate and moving relative to the top...
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creator | ROBERTSON DEREK DAVIS, JR. WILLIE T PYMENTO LARRY G |
description | An apparatus includes a top plate and an extension card surrounding a space for a small electronic assembly. The extension card and small electronic assembly are mounted to the top plate. The apparatus includes a plurality of test probes extending through the top plate and moving relative to the top plate. A portion of the test probes are positioned to contact the extension card and a portion are positioned to contact the small electronic assembly when the test probes move with respect to the top plate. The apparatus includes a vacuum box in contact with the top plate and surrounding the extension card and small electronic assembly. The top plate moves relative to the test probes so the test probes contact the extension card and the small electronic assembly in response to a vacuum force evacuating an area under the top plate and within the vacuum box. |
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WILLIE T</creatorcontrib><creatorcontrib>PYMENTO LARRY G</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ROBERTSON DEREK</au><au>DAVIS, JR. WILLIE T</au><au>PYMENTO LARRY G</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD TO IMPROVE STRAIN RATE CONTROL OF SMALL LEAD FREE PRINTED CIRCUIT BOARD ASSEMBLY DURING IN CIRCUIT TEST PROCESS</title><date>2016-01-28</date><risdate>2016</risdate><abstract>An apparatus includes a top plate and an extension card surrounding a space for a small electronic assembly. The extension card and small electronic assembly are mounted to the top plate. The apparatus includes a plurality of test probes extending through the top plate and moving relative to the top plate. 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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | METHOD TO IMPROVE STRAIN RATE CONTROL OF SMALL LEAD FREE PRINTED CIRCUIT BOARD ASSEMBLY DURING IN CIRCUIT TEST PROCESS |
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