AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS

Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include m...

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Bibliographische Detailangaben

1. Verfasser:	WILLIAMS SCOTT TERRELL
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
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