AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS

AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS

Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include m...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: WILLIAMS SCOTT TERRELL
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WILLIAMS SCOTT TERRELL
description Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest with corresponding second features of interest in a second. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest and the corresponding second feature of interest.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2016018961A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2016018961A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2016018961A13</originalsourceid><addsrcrecordid>eNrjZDB3DA3x93UMcXVRcHEMcVTwD3MN8nGMVPD0AyKX0OCQIE9HHwVffz_PEP8gTz93heDI4BBX32AeBta0xJziVF4ozc2g7OYa4uyhm1qQH59aXJCYnJqXWhIfGmxkYGhmYGhhaWboaGhMnCoABfUpig</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS</title><source>esp@cenet</source><creator>WILLIAMS SCOTT TERRELL</creator><creatorcontrib>WILLIAMS SCOTT TERRELL</creatorcontrib><description>Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest with corresponding second features of interest in a second. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest and the corresponding second feature of interest.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20160121&amp;DB=EPODOC&amp;CC=US&amp;NR=2016018961A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20160121&amp;DB=EPODOC&amp;CC=US&amp;NR=2016018961A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WILLIAMS SCOTT TERRELL</creatorcontrib><title>AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS</title><description>Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest with corresponding second features of interest in a second. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest and the corresponding second feature of interest.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB3DA3x93UMcXVRcHEMcVTwD3MN8nGMVPD0AyKX0OCQIE9HHwVffz_PEP8gTz93heDI4BBX32AeBta0xJziVF4ozc2g7OYa4uyhm1qQH59aXJCYnJqXWhIfGmxkYGhmYGhhaWboaGhMnCoABfUpig</recordid><startdate>20160121</startdate><enddate>20160121</enddate><creator>WILLIAMS SCOTT TERRELL</creator><scope>EVB</scope></search><sort><creationdate>20160121</creationdate><title>AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS</title><author>WILLIAMS SCOTT TERRELL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2016018961A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>WILLIAMS SCOTT TERRELL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WILLIAMS SCOTT TERRELL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS</title><date>2016-01-21</date><risdate>2016</risdate><abstract>Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest with corresponding second features of interest in a second. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest and the corresponding second feature of interest.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2016018961A1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title AUTOMATED DATA OVERLAY IN INDUSTRIAL MONITORING SYSTEMS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T06%3A33%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WILLIAMS%20SCOTT%20TERRELL&rft.date=2016-01-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2016018961A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true