METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT
A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a...
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creator | KALIAPERUMAL SOUNDARRAJAN PERRETT DAVID GEORGE SWYERS GALEN LEE GRONINGER DANIEL SCOTT |
description | A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2015362462A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2015362462A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2015362462A13</originalsourceid><addsrcrecordid>eNrjZHD0dQ3x8HdRcPRzUQiODA5x9VVw8w9ScHVxiVRwDg0KcvULUXBxDfN0dlVwifRz9PV0VnB39PRTcHTxCg0O8QVK8zCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwNDU2MzIxMzI0dDY-JUAQBr0Cu2</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT</title><source>esp@cenet</source><creator>KALIAPERUMAL SOUNDARRAJAN ; PERRETT DAVID GEORGE ; SWYERS GALEN LEE ; GRONINGER DANIEL SCOTT</creator><creatorcontrib>KALIAPERUMAL SOUNDARRAJAN ; PERRETT DAVID GEORGE ; SWYERS GALEN LEE ; GRONINGER DANIEL SCOTT</creatorcontrib><description>A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151217&DB=EPODOC&CC=US&NR=2015362462A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20151217&DB=EPODOC&CC=US&NR=2015362462A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KALIAPERUMAL SOUNDARRAJAN</creatorcontrib><creatorcontrib>PERRETT DAVID GEORGE</creatorcontrib><creatorcontrib>SWYERS GALEN LEE</creatorcontrib><creatorcontrib>GRONINGER DANIEL SCOTT</creatorcontrib><title>METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT</title><description>A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD0dQ3x8HdRcPRzUQiODA5x9VVw8w9ScHVxiVRwDg0KcvULUXBxDfN0dlVwifRz9PV0VnB39PRTcHTxCg0O8QVK8zCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwNDU2MzIxMzI0dDY-JUAQBr0Cu2</recordid><startdate>20151217</startdate><enddate>20151217</enddate><creator>KALIAPERUMAL SOUNDARRAJAN</creator><creator>PERRETT DAVID GEORGE</creator><creator>SWYERS GALEN LEE</creator><creator>GRONINGER DANIEL SCOTT</creator><scope>EVB</scope></search><sort><creationdate>20151217</creationdate><title>METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT</title><author>KALIAPERUMAL SOUNDARRAJAN ; PERRETT DAVID GEORGE ; SWYERS GALEN LEE ; GRONINGER DANIEL SCOTT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2015362462A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KALIAPERUMAL SOUNDARRAJAN</creatorcontrib><creatorcontrib>PERRETT DAVID GEORGE</creatorcontrib><creatorcontrib>SWYERS GALEN LEE</creatorcontrib><creatorcontrib>GRONINGER DANIEL SCOTT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KALIAPERUMAL SOUNDARRAJAN</au><au>PERRETT DAVID GEORGE</au><au>SWYERS GALEN LEE</au><au>GRONINGER DANIEL SCOTT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT</title><date>2015-12-17</date><risdate>2015</risdate><abstract>A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT |
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