MEASURING DEVICE FOR ACQUIRING SURFACE DATA AND/OR INTERFACES OF A WORKPIECE TO BE PROCESSED BY A LASER PROCESSING DEVICE

MEASURING DEVICE FOR ACQUIRING SURFACE DATA AND/OR INTERFACES OF A WORKPIECE TO BE PROCESSED BY A LASER PROCESSING DEVICE

The invention relates to a measuring device for acquiring surface data and/or interfaces of a workpiece to be processed by a laser processing device. The laser processing device comprises a laser source and a processing head which is configured to provide at least one high-energy processing beam, in...

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Hauptverfasser: LESSMÜLLER ECKHARD, TRUCKENBRODT CHRISTIAN
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator LESSMÜLLER ECKHARD
TRUCKENBRODT CHRISTIAN
description The invention relates to a measuring device for acquiring surface data and/or interfaces of a workpiece to be processed by a laser processing device. The laser processing device comprises a laser source and a processing head which is configured to provide at least one high-energy processing beam, in particular a laser beam. The laser source and the processing head are interconnected by an optical fibre and the measuring device comprises a scanning device configured as an optical coherence tomograph for surface scanning and/or interface scanning of the workpiece. The optical fibre which interconnects the laser source and the processing head forms a component of the scanning device.
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subjects BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title MEASURING DEVICE FOR ACQUIRING SURFACE DATA AND/OR INTERFACES OF A WORKPIECE TO BE PROCESSED BY A LASER PROCESSING DEVICE
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