ON CHIP CHARACTERIZATION OF TIMING PARAMETERS FOR MEMORY PORTS

This invention is a circuit and method for memory characterization. The circuit includes first and second programmable delay lines, address and data registers, an output register and a finite state machine controller. The finite state machine controller supplies an address to said address register,...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KASHYAP ABHIJITH RAMESH, PUNDOOR SHRIKRISHNA
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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