METHOD AND APPARATUS FOR THREE DIMENSIONAL ION IMPLANTATION

A scan system for processing a substrate with an ion beam may include a scanner to receive the ion beam having a shape of a ribbon beam, the ribbon beam having a beam width along a first axis and beam height along a second axis that is perpendicular to the first axis, the beam width being at least t...

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1. Verfasser: CHANG SHENGWU
Format: Patent
Sprache:eng
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