AQUEOUS CLEAN SOLUTION WITH LOW COPPER ETCH RATE FOR ORGANIC RESIDUE REMOVAL IMPROVEMENT

A cleaning composition and process for cleaning post-chemical mechanical polishing (CMP) residue and contaminants from a microelectronic device having said residue and contaminants thereon. The cleaning compositions include at least one quaternary base, at least one amine, at least one corrosion inh...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JENQ SHRANE NING, LIU JUN, THOMAS NICOLE, BOGGS KARL E
Format: Patent
Sprache:eng
Schlagworte:
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