Device and Method For the Simultaneous Three-Dimensional Measurement of Surfaces With Several Wavelengths

Device and Method For the Simultaneous Three-Dimensional Measurement of Surfaces With Several Wavelengths

The invention relates to an apparatus for the three-dimensional measurement of an object, and comprises a projection system for projecting a pattern onto a surface by means of electromagnetic radiation having at least two different wavelengths or at least two different wavelength ranges; and a detec...

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1. Verfasser: WIEDENMANN ERNST
Format: Patent
Sprache:eng
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MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator WIEDENMANN ERNST
description The invention relates to an apparatus for the three-dimensional measurement of an object, and comprises a projection system for projecting a pattern onto a surface by means of electromagnetic radiation having at least two different wavelengths or at least two different wavelength ranges; and a detector system for detecting the projected pattern at the at least two different wavelengths or at at least two different respective wavelengths from the at least two different wavelength ranges. The invention further relates to a method for the three-dimensional measurement of an object.
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Device and Method For the Simultaneous Three-Dimensional Measurement of Surfaces With Several Wavelengths
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