TEST DEVICE AND TEST SYSTEM INCLUDING THE SAME

A test device includes a test unit and a voltage selection circuit. The test unit is configured to detect a voltage at a test pad of a semiconductor device under test by applying a test current to the test pad. The voltage selection circuit is configured to apply a selection voltage to a ground pad...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HAN SANG-KYEONG, SONG KI-JAE, JANG UNG-JIN, YOO JONG-WOON
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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