FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT

An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain t...

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Hauptverfasser: HUANG CHANGHE, BRUSATORI MICHELLE A, THRUSH CHRISTOPHER M, AUNER GREGORY
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creator HUANG CHANGHE
BRUSATORI MICHELLE A
THRUSH CHRISTOPHER M
AUNER GREGORY
description An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a plurality of alternating-slope stairsteps, wherein the portion of the step disposed parallel to the base of the diffraction grating is disposed so as to be orthogonal to the path of the scattered light from the second optical chain. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2015029504A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2015029504A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2015029504A13</originalsourceid><addsrcrecordid>eNrjZHBy8w8N8nQN0g0JcvQLdvMP8lXw9AtxDXJzDfL3dQUyFMI9QzwUgkMcPYOcHYNdFYJc3XxcnUM8w1wVXH1cfV39QngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBoamBkaWpgYmjoTFxqgD-Myyz</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT</title><source>esp@cenet</source><creator>HUANG CHANGHE ; BRUSATORI MICHELLE A ; THRUSH CHRISTOPHER M ; AUNER GREGORY</creator><creatorcontrib>HUANG CHANGHE ; BRUSATORI MICHELLE A ; THRUSH CHRISTOPHER M ; AUNER GREGORY</creatorcontrib><description>An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a plurality of alternating-slope stairsteps, wherein the portion of the step disposed parallel to the base of the diffraction grating is disposed so as to be orthogonal to the path of the scattered light from the second optical chain. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.</description><language>eng</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150129&amp;DB=EPODOC&amp;CC=US&amp;NR=2015029504A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150129&amp;DB=EPODOC&amp;CC=US&amp;NR=2015029504A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG CHANGHE</creatorcontrib><creatorcontrib>BRUSATORI MICHELLE A</creatorcontrib><creatorcontrib>THRUSH CHRISTOPHER M</creatorcontrib><creatorcontrib>AUNER GREGORY</creatorcontrib><title>FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT</title><description>An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a plurality of alternating-slope stairsteps, wherein the portion of the step disposed parallel to the base of the diffraction grating is disposed so as to be orthogonal to the path of the scattered light from the second optical chain. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBy8w8N8nQN0g0JcvQLdvMP8lXw9AtxDXJzDfL3dQUyFMI9QzwUgkMcPYOcHYNdFYJc3XxcnUM8w1wVXH1cfV39QngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBoamBkaWpgYmjoTFxqgD-Myyz</recordid><startdate>20150129</startdate><enddate>20150129</enddate><creator>HUANG CHANGHE</creator><creator>BRUSATORI MICHELLE A</creator><creator>THRUSH CHRISTOPHER M</creator><creator>AUNER GREGORY</creator><scope>EVB</scope></search><sort><creationdate>20150129</creationdate><title>FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT</title><author>HUANG CHANGHE ; BRUSATORI MICHELLE A ; THRUSH CHRISTOPHER M ; AUNER GREGORY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2015029504A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG CHANGHE</creatorcontrib><creatorcontrib>BRUSATORI MICHELLE A</creatorcontrib><creatorcontrib>THRUSH CHRISTOPHER M</creatorcontrib><creatorcontrib>AUNER GREGORY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG CHANGHE</au><au>BRUSATORI MICHELLE A</au><au>THRUSH CHRISTOPHER M</au><au>AUNER GREGORY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT</title><date>2015-01-29</date><risdate>2015</risdate><abstract>An apparatus for performing Raman spectral analysis of a sample is described, comprising a coherent light source, an first optical chain to direct the coherent light to impinge on the sample, a second optical chain to direct the scattered light onto a diffraction grating, and a third optical chain to direct the diffracted light onto detection array. The diffraction grating is a plurality of alternating-slope stairsteps, wherein the portion of the step disposed parallel to the base of the diffraction grating is disposed so as to be orthogonal to the path of the scattered light from the second optical chain. The zeroth-order fringe is selected by a slit and directed onto camera. The resultant interferogram is Fourier transformed to produce a representation of the Raman spectrum.</abstract><oa>free_for_read</oa></addata></record>
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subjects COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
title FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT
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