METHOD AND APPARATUS FOR IDENTIFYING ROOT CAUSE OF DEFECT USING COMPOSITE DEFECT MAP

Provided are a method and apparatus for automatically determining defective equipment by using a sample defect map showing defect distribution in each cell of a defective sample and production history information of each product, wherein the defective sample is a set of products, each being divided...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: DOO MIN KYUN, SHIN KAE YOUNG
Format: Patent
Sprache:eng
Schlagworte:
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