METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT

One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the p...

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Hauptverfasser: TSENG CHIAHSUN, JANG LINUS, MATSUI YOSHINORI
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creator TSENG CHIAHSUN
JANG LINUS
MATSUI YOSHINORI
description One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the patterned layer of photoresist, wherein the spacer defines a reduced-size opening, performing an etching process through the reduced-size opening on the layer of insulating material to define a trench/hole type feature in the layer of insulating material, and forming a conductive structure in the trench/hole type feature in the layer of insulating material.
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT
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