METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT
One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the p...
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creator | TSENG CHIAHSUN JANG LINUS MATSUI YOSHINORI |
description | One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the patterned layer of photoresist, wherein the spacer defines a reduced-size opening, performing an etching process through the reduced-size opening on the layer of insulating material to define a trench/hole type feature in the layer of insulating material, and forming a conductive structure in the trench/hole type feature in the layer of insulating material. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2014273443A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2014273443A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2014273443A13</originalsourceid><addsrcrecordid>eNqNirsKwkAQRdNYiPoPA9aieYD1sJnNLiS7YTJbpApB10o0EP8fE_ADrM7l3LNN7g2J8WUHXoP23FhXgTA5Zc7G1wTStwSaUAJTB9YBQo098do3KMQW63WjW06hihdXgrKsghVo2ZdByT7ZPMbnHA8_7pKjJlHmFKf3EOdpvMVX_Ayhyy5pkV3zosgxzf-rvuUwNQo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT</title><source>esp@cenet</source><creator>TSENG CHIAHSUN ; JANG LINUS ; MATSUI YOSHINORI</creator><creatorcontrib>TSENG CHIAHSUN ; JANG LINUS ; MATSUI YOSHINORI</creatorcontrib><description>One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the patterned layer of photoresist, wherein the spacer defines a reduced-size opening, performing an etching process through the reduced-size opening on the layer of insulating material to define a trench/hole type feature in the layer of insulating material, and forming a conductive structure in the trench/hole type feature in the layer of insulating material.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140918&DB=EPODOC&CC=US&NR=2014273443A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140918&DB=EPODOC&CC=US&NR=2014273443A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TSENG CHIAHSUN</creatorcontrib><creatorcontrib>JANG LINUS</creatorcontrib><creatorcontrib>MATSUI YOSHINORI</creatorcontrib><title>METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT</title><description>One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the patterned layer of photoresist, wherein the spacer defines a reduced-size opening, performing an etching process through the reduced-size opening on the layer of insulating material to define a trench/hole type feature in the layer of insulating material, and forming a conductive structure in the trench/hole type feature in the layer of insulating material.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirsKwkAQRdNYiPoPA9aieYD1sJnNLiS7YTJbpApB10o0EP8fE_ADrM7l3LNN7g2J8WUHXoP23FhXgTA5Zc7G1wTStwSaUAJTB9YBQo098do3KMQW63WjW06hihdXgrKsghVo2ZdByT7ZPMbnHA8_7pKjJlHmFKf3EOdpvMVX_Ayhyy5pkV3zosgxzf-rvuUwNQo</recordid><startdate>20140918</startdate><enddate>20140918</enddate><creator>TSENG CHIAHSUN</creator><creator>JANG LINUS</creator><creator>MATSUI YOSHINORI</creator><scope>EVB</scope></search><sort><creationdate>20140918</creationdate><title>METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT</title><author>TSENG CHIAHSUN ; JANG LINUS ; MATSUI YOSHINORI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014273443A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>TSENG CHIAHSUN</creatorcontrib><creatorcontrib>JANG LINUS</creatorcontrib><creatorcontrib>MATSUI YOSHINORI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TSENG CHIAHSUN</au><au>JANG LINUS</au><au>MATSUI YOSHINORI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT</title><date>2014-09-18</date><risdate>2014</risdate><abstract>One illustrative method disclosed herein involves forming a layer of insulating material, forming a patterned layer of photoresist above the layer of insulating material, wherein the patterned layer of photoresist has an opening defined therein, forming an internal spacer within the opening in the patterned layer of photoresist, wherein the spacer defines a reduced-size opening, performing an etching process through the reduced-size opening on the layer of insulating material to define a trench/hole type feature in the layer of insulating material, and forming a conductive structure in the trench/hole type feature in the layer of insulating material.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | METHODS OF FORMING TRENCH/HOLE TYPE FEATURES IN A LAYER OF MATERIAL OF AN INTEGRATED CIRCUIT PRODUCT |
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