HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT

An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provid...

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Hauptverfasser: MATHEW SANU K, PARKER RACHAEL J, KRISHNAMURTHY RAM K
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creator MATHEW SANU K
PARKER RACHAEL J
KRISHNAMURTHY RAM K
description An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2014266297A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2014266297A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2014266297A13</originalsourceid><addsrcrecordid>eNqNi7EKwjAUALM4iPoPD5wDNkqL42vzaoM0gZfU4lSKxEm0UP8fI_gBTnfD3VL0DbLukUlSW5LWpOFMVyjRJ3MWGK12LVyQDQbjrAdXA4IPTN7L70w2lcbSiTEkqwxXnQlrsbiPjzluflyJbU2hamScXkOcp_EWn_E9dF7tsoPKc3UsMNv_V30ASqwxkw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT</title><source>esp@cenet</source><creator>MATHEW SANU K ; PARKER RACHAEL J ; KRISHNAMURTHY RAM K</creator><creatorcontrib>MATHEW SANU K ; PARKER RACHAEL J ; KRISHNAMURTHY RAM K</creatorcontrib><description>An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; ELECTRICITY ; PULSE TECHNIQUE</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140918&amp;DB=EPODOC&amp;CC=US&amp;NR=2014266297A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140918&amp;DB=EPODOC&amp;CC=US&amp;NR=2014266297A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MATHEW SANU K</creatorcontrib><creatorcontrib>PARKER RACHAEL J</creatorcontrib><creatorcontrib>KRISHNAMURTHY RAM K</creatorcontrib><title>HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT</title><description>An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>PULSE TECHNIQUE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7EKwjAUALM4iPoPD5wDNkqL42vzaoM0gZfU4lSKxEm0UP8fI_gBTnfD3VL0DbLukUlSW5LWpOFMVyjRJ3MWGK12LVyQDQbjrAdXA4IPTN7L70w2lcbSiTEkqwxXnQlrsbiPjzluflyJbU2hamScXkOcp_EWn_E9dF7tsoPKc3UsMNv_V30ASqwxkw</recordid><startdate>20140918</startdate><enddate>20140918</enddate><creator>MATHEW SANU K</creator><creator>PARKER RACHAEL J</creator><creator>KRISHNAMURTHY RAM K</creator><scope>EVB</scope></search><sort><creationdate>20140918</creationdate><title>HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT</title><author>MATHEW SANU K ; PARKER RACHAEL J ; KRISHNAMURTHY RAM K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014266297A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>PULSE TECHNIQUE</topic><toplevel>online_resources</toplevel><creatorcontrib>MATHEW SANU K</creatorcontrib><creatorcontrib>PARKER RACHAEL J</creatorcontrib><creatorcontrib>KRISHNAMURTHY RAM K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MATHEW SANU K</au><au>PARKER RACHAEL J</au><au>KRISHNAMURTHY RAM K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT</title><date>2014-09-18</date><risdate>2014</risdate><abstract>An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
PULSE TECHNIQUE
title HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T16%3A50%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MATHEW%20SANU%20K&rft.date=2014-09-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2014266297A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true