SYSTEM AND METHOD FOR MANAGING TRACEABILITY SUSPICION WITH SUSPECT PROFILES

A method, computer program product, and computer system for generating, at a computing device, a first suspect profile of a plurality of suspect profiles that includes one or more characteristics, wherein the first suspect profile is associated with a traceability link between at least two artifacts...

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Hauptverfasser: DANFORD PATRICK J, DECANDIO GEORGE P, RAMASWAMY VISHWANATH, BAUMBACH MARC A, FUNKHOUSER CHRISTIAN, GROTJOHN DAVID K
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creator DANFORD PATRICK J
DECANDIO GEORGE P
RAMASWAMY VISHWANATH
BAUMBACH MARC A
FUNKHOUSER CHRISTIAN
GROTJOHN DAVID K
description A method, computer program product, and computer system for generating, at a computing device, a first suspect profile of a plurality of suspect profiles that includes one or more characteristics, wherein the first suspect profile is associated with a traceability link between at least two artifacts. A change to a first characteristic associated with a first artifact of the at least two artifacts is determined. Which of the plurality of suspect profiles includes the first characteristic is determined. The first characteristic is matched to the first suspect profile of the plurality of suspect profiles based upon, at least in part, determining that the first suspect profile includes the first characteristic. The traceability link is marked as suspect based upon, at least in part, matching the first characteristic to the first suspect profile.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2014258981A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2014258981A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2014258981A13</originalsourceid><addsrcrecordid>eNrjZPAOjgwOcfVVcPRzUfB1DfHwd1Fw8w9S8HX0c3T39HNXCAlydHZ1dPL08QyJVAgODQ7wdPb091MI9wzxAHNdnUMUAoL83Tx9XIN5GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgaGJkamFpYWho6ExcaoAZKAu-Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM AND METHOD FOR MANAGING TRACEABILITY SUSPICION WITH SUSPECT PROFILES</title><source>esp@cenet</source><creator>DANFORD PATRICK J ; DECANDIO GEORGE P ; RAMASWAMY VISHWANATH ; BAUMBACH MARC A ; FUNKHOUSER CHRISTIAN ; GROTJOHN DAVID K</creator><creatorcontrib>DANFORD PATRICK J ; DECANDIO GEORGE P ; RAMASWAMY VISHWANATH ; BAUMBACH MARC A ; FUNKHOUSER CHRISTIAN ; GROTJOHN DAVID K</creatorcontrib><description>A method, computer program product, and computer system for generating, at a computing device, a first suspect profile of a plurality of suspect profiles that includes one or more characteristics, wherein the first suspect profile is associated with a traceability link between at least two artifacts. A change to a first characteristic associated with a first artifact of the at least two artifacts is determined. Which of the plurality of suspect profiles includes the first characteristic is determined. The first characteristic is matched to the first suspect profile of the plurality of suspect profiles based upon, at least in part, determining that the first suspect profile includes the first characteristic. The traceability link is marked as suspect based upon, at least in part, matching the first characteristic to the first suspect profile.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140911&amp;DB=EPODOC&amp;CC=US&amp;NR=2014258981A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140911&amp;DB=EPODOC&amp;CC=US&amp;NR=2014258981A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DANFORD PATRICK J</creatorcontrib><creatorcontrib>DECANDIO GEORGE P</creatorcontrib><creatorcontrib>RAMASWAMY VISHWANATH</creatorcontrib><creatorcontrib>BAUMBACH MARC A</creatorcontrib><creatorcontrib>FUNKHOUSER CHRISTIAN</creatorcontrib><creatorcontrib>GROTJOHN DAVID K</creatorcontrib><title>SYSTEM AND METHOD FOR MANAGING TRACEABILITY SUSPICION WITH SUSPECT PROFILES</title><description>A method, computer program product, and computer system for generating, at a computing device, a first suspect profile of a plurality of suspect profiles that includes one or more characteristics, wherein the first suspect profile is associated with a traceability link between at least two artifacts. A change to a first characteristic associated with a first artifact of the at least two artifacts is determined. Which of the plurality of suspect profiles includes the first characteristic is determined. The first characteristic is matched to the first suspect profile of the plurality of suspect profiles based upon, at least in part, determining that the first suspect profile includes the first characteristic. The traceability link is marked as suspect based upon, at least in part, matching the first characteristic to the first suspect profile.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAOjgwOcfVVcPRzUfB1DfHwd1Fw8w9S8HX0c3T39HNXCAlydHZ1dPL08QyJVAgODQ7wdPb091MI9wzxAHNdnUMUAoL83Tx9XIN5GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgaGJkamFpYWho6ExcaoAZKAu-Q</recordid><startdate>20140911</startdate><enddate>20140911</enddate><creator>DANFORD PATRICK J</creator><creator>DECANDIO GEORGE P</creator><creator>RAMASWAMY VISHWANATH</creator><creator>BAUMBACH MARC A</creator><creator>FUNKHOUSER CHRISTIAN</creator><creator>GROTJOHN DAVID K</creator><scope>EVB</scope></search><sort><creationdate>20140911</creationdate><title>SYSTEM AND METHOD FOR MANAGING TRACEABILITY SUSPICION WITH SUSPECT PROFILES</title><author>DANFORD PATRICK J ; DECANDIO GEORGE P ; RAMASWAMY VISHWANATH ; BAUMBACH MARC A ; FUNKHOUSER CHRISTIAN ; GROTJOHN DAVID K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014258981A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>DANFORD PATRICK J</creatorcontrib><creatorcontrib>DECANDIO GEORGE P</creatorcontrib><creatorcontrib>RAMASWAMY VISHWANATH</creatorcontrib><creatorcontrib>BAUMBACH MARC A</creatorcontrib><creatorcontrib>FUNKHOUSER CHRISTIAN</creatorcontrib><creatorcontrib>GROTJOHN DAVID K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DANFORD PATRICK J</au><au>DECANDIO GEORGE P</au><au>RAMASWAMY VISHWANATH</au><au>BAUMBACH MARC A</au><au>FUNKHOUSER CHRISTIAN</au><au>GROTJOHN DAVID K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM AND METHOD FOR MANAGING TRACEABILITY SUSPICION WITH SUSPECT PROFILES</title><date>2014-09-11</date><risdate>2014</risdate><abstract>A method, computer program product, and computer system for generating, at a computing device, a first suspect profile of a plurality of suspect profiles that includes one or more characteristics, wherein the first suspect profile is associated with a traceability link between at least two artifacts. A change to a first characteristic associated with a first artifact of the at least two artifacts is determined. Which of the plurality of suspect profiles includes the first characteristic is determined. The first characteristic is matched to the first suspect profile of the plurality of suspect profiles based upon, at least in part, determining that the first suspect profile includes the first characteristic. The traceability link is marked as suspect based upon, at least in part, matching the first characteristic to the first suspect profile.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title SYSTEM AND METHOD FOR MANAGING TRACEABILITY SUSPICION WITH SUSPECT PROFILES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T06%3A35%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DANFORD%20PATRICK%20J&rft.date=2014-09-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2014258981A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true