MULTIPLE MANUFACTURING LINE QUALIFICATION

MULTIPLE MANUFACTURING LINE QUALIFICATION

Methods and systems for multiple manufacturing line qualification are provided. A method includes establishing a product template and producing products on one or more manufacturing lines. The products include product macros placed on a chip. The method also includes establishing allowed parametric...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HEDBERG ERIK L, BICKFORD JEANNE P, DEZFULIAN KEVIN K
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HEDBERG ERIK L
BICKFORD JEANNE P
DEZFULIAN KEVIN K
description Methods and systems for multiple manufacturing line qualification are provided. A method includes establishing a product template and producing products on one or more manufacturing lines. The products include product macros placed on a chip. The method also includes establishing allowed parametric match from line to line. The method further includes determining that products from the one or more manufacturing lines meet the allowed parametric match.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2014188266A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2014188266A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2014188266A13</originalsourceid><addsrcrecordid>eNrjZND0DfUJ8QzwcVXwdfQLdXN0DgkN8vRzV_Dx9HNVCAx19PF083R2DPH09-NhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhiaGFhZGZmaOhsbEqQIA4H4loQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MULTIPLE MANUFACTURING LINE QUALIFICATION</title><source>esp@cenet</source><creator>HEDBERG ERIK L ; BICKFORD JEANNE P ; DEZFULIAN KEVIN K</creator><creatorcontrib>HEDBERG ERIK L ; BICKFORD JEANNE P ; DEZFULIAN KEVIN K</creatorcontrib><description>Methods and systems for multiple manufacturing line qualification are provided. A method includes establishing a product template and producing products on one or more manufacturing lines. The products include product macros placed on a chip. The method also includes establishing allowed parametric match from line to line. The method further includes determining that products from the one or more manufacturing lines meet the allowed parametric match.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140703&amp;DB=EPODOC&amp;CC=US&amp;NR=2014188266A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140703&amp;DB=EPODOC&amp;CC=US&amp;NR=2014188266A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HEDBERG ERIK L</creatorcontrib><creatorcontrib>BICKFORD JEANNE P</creatorcontrib><creatorcontrib>DEZFULIAN KEVIN K</creatorcontrib><title>MULTIPLE MANUFACTURING LINE QUALIFICATION</title><description>Methods and systems for multiple manufacturing line qualification are provided. A method includes establishing a product template and producing products on one or more manufacturing lines. The products include product macros placed on a chip. The method also includes establishing allowed parametric match from line to line. The method further includes determining that products from the one or more manufacturing lines meet the allowed parametric match.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND0DfUJ8QzwcVXwdfQLdXN0DgkN8vRzV_Dx9HNVCAx19PF083R2DPH09-NhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhiaGFhZGZmaOhsbEqQIA4H4loQ</recordid><startdate>20140703</startdate><enddate>20140703</enddate><creator>HEDBERG ERIK L</creator><creator>BICKFORD JEANNE P</creator><creator>DEZFULIAN KEVIN K</creator><scope>EVB</scope></search><sort><creationdate>20140703</creationdate><title>MULTIPLE MANUFACTURING LINE QUALIFICATION</title><author>HEDBERG ERIK L ; BICKFORD JEANNE P ; DEZFULIAN KEVIN K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014188266A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HEDBERG ERIK L</creatorcontrib><creatorcontrib>BICKFORD JEANNE P</creatorcontrib><creatorcontrib>DEZFULIAN KEVIN K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HEDBERG ERIK L</au><au>BICKFORD JEANNE P</au><au>DEZFULIAN KEVIN K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MULTIPLE MANUFACTURING LINE QUALIFICATION</title><date>2014-07-03</date><risdate>2014</risdate><abstract>Methods and systems for multiple manufacturing line qualification are provided. A method includes establishing a product template and producing products on one or more manufacturing lines. The products include product macros placed on a chip. The method also includes establishing allowed parametric match from line to line. The method further includes determining that products from the one or more manufacturing lines meet the allowed parametric match.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2014188266A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title MULTIPLE MANUFACTURING LINE QUALIFICATION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T10%3A41%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HEDBERG%20ERIK%20L&rft.date=2014-07-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2014188266A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true